Title :
Measurement and prediction of reliability for double-sided area array assemblies
Author :
Meifunas, M. ; Pitarresi, James M. ; Primavera, Anthony ; Mandepudi, Shiva Kalyan ; Parupalli, Satish
Author_Institution :
Universal Instruments Corporation
Keywords :
Area measurement; Assembly; Capacitors; Circuit testing; Electronics packaging; Life estimation; Mirrors; Predictive models; Printed circuits; Soldering;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216543
