DocumentCode :
171852
Title :
A review on the testing method for low residual voltages in SPD
Author :
Young-Jun Lee ; Kihong Lee
Author_Institution :
SungJin Techwin Co., Ltd., Daejeon, South Korea
fYear :
2014
fDate :
11-18 Oct. 2014
Firstpage :
273
Lastpage :
277
Abstract :
Technical issues on measuring the low residual voltage (Vres) in SPD determined in international standards are reviewed. The SPD for power supplies represents residual voltages more than 1.5kV but the SPD for applications in low voltage data, communications and signaling circuits shows several tens ~ hundreds volts. Thus, it is necessary to determine detailed technical specifications in a technical standard for implementing its accurate measurements. However, there are no such detailed specifications in international standards and that may cause confusions in operating a certification system based on the international standard for SPD performance. Therefore, in this study, technical issues on international standards for measuring the low residual voltages of SPD are reviewed.
Keywords :
IEC standards; surge protection; voltage measurement; SPD; international standards; low residual voltage measurement; surge protective devices; Low voltage; Measurement uncertainty; Noise measurement; Probes; Standards; IEC; SPD; bandwith; impulse; residual voltage(Ures); voltage probe;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lightning Protection (ICLP), 2014 International Conference o
Conference_Location :
Shanghai
Type :
conf
DOI :
10.1109/ICLP.2014.6973135
Filename :
6973135
Link To Document :
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