Title :
Microwave measurements on dielectric constants and dissipation factors of dielectric materials
Author :
Park, Jeong ; Lee, Jong S. ; Lee, Chin C.
Author_Institution :
University of California
Keywords :
Dielectric constant; Dielectric losses; Dielectric materials; Dielectric measurements; Electromagnetic scattering; Frequency; Impedance; Microwave measurements; Packaging; Permittivity measurement;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216546
