Title :
SMT process robustness and board level solder joint reliability of C2BGA
Author :
Zhou, Tiao ; Villa, Claudio M. ; Tee, Tong Yan ; Du, Haibin
Author_Institution :
STMicroelectronics
Keywords :
Electronic packaging thermal management; Electronics packaging; Environmentally friendly manufacturing techniques; Fatigue; Lead; Materials reliability; Robustness; Soldering; Surface-mount technology; Temperature;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216559