DocumentCode :
1719100
Title :
Two-dimensional MHD simulation of plasma closure in high current-density diodes
Author :
Turchi, Peter J. ; Peterkin, R.E.
Author_Institution :
Phillips Lab., Kirtland AFB, NM, USA
fYear :
1997
Firstpage :
122
Lastpage :
123
Abstract :
Summary form only given. Operation of charged-particle beam diodes is often limited by closure of the interelectrode gap due to plasmas created at the electrode surfaces. In particular, cold-emission cathodes that depend on the generation of plasmas by external means or by explosion of surface asperities (e.g., whiskers) are immediately subject to the consequences of such plasmas. These consequences include variation of the diode impedance with time during the current pulse, curtailment of the pulsetime, and limitation of the ability to operate the diode repetitively. Plasma closure in diodes has been observed experimentally for many years and found to depend strongly on the cathode material, but relatively weakly on operating current and voltage. The present paper describes the use of the MACH2 code to simulate the dynamics of a plasma layer adjacent to the cathode of a high current-density diode. MACH2 is a 2-1/2 dimensional MHD code that includes resistive diffusion of magnetic flux, thermal transport by conduction and radiation, separate ion, electron and photon temperature, anomalous resistivity models, and access to properties of partially-ionized gases (e.g., SESAME tables).
Keywords :
plasma density; plasma diodes; plasma magnetohydrodynamics; plasma simulation; plasma temperature; plasma transport processes; MACH2 code; SESAME tables; cathode material; charged-particle beam diodes; cold-emission cathodes; conduction; electrode surfaces; electron temperature; high current-density diodes; interelectrode gap; ion temperature; magnetic flux; partially-ionized gases; photon temperature; plasma closure; plasma layer; radiation; resistive diffusion; resistivity models; surface asperities; thermal transport; two-dimensional MHD simulation; whiskers; Cathodes; Diodes; Electrodes; Explosions; Magnetohydrodynamics; Particle beams; Plasma materials processing; Plasma simulation; Plasma temperature; Surface impedance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3990-8
Type :
conf
DOI :
10.1109/PLASMA.1997.604367
Filename :
604367
Link To Document :
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