• DocumentCode
    171932
  • Title

    Measuring capacitance of various types of structures

  • Author

    Dulik, Miroslav ; Jurecka, Stanislav

  • Author_Institution
    Inst. of Aurel Stodola, Univ. of Zilina, Liptovsky Mikulas, Slovakia
  • fYear
    2014
  • fDate
    19-20 May 2014
  • Firstpage
    640
  • Lastpage
    644
  • Abstract
    Capacitance-voltage measurement is one of the methods to obtain information about an electrical system, circuit or circuit element. Different capacitors have different properties, like maximum capacitance or variable capacitance depending on input voltage. This second characteristic is especially particular for MOS structures. To measure this variable capacitance, it´s necessary to use measuring device which is capable of changing input voltage and measuring capacitor voltage during the all charging process. We proposed experimental method suitable for analysis of transient processes connected with charging of capacitive circuits.
  • Keywords
    MOS capacitors; capacitance measurement; voltage measurement; MOS structure; capacitance-voltage measurement; capacitive circuit; capacitor; circuit element; electrical system; transient process analysis; Area measurement; Capacitance; Capacitors; Steady-state; MOS; capacitance; capacitor; measuring; methods; semiconductors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ELEKTRO, 2014
  • Conference_Location
    Rajecke Teplice
  • Print_ISBN
    978-1-4799-3720-2
  • Type

    conf

  • DOI
    10.1109/ELEKTRO.2014.6848978
  • Filename
    6848978