DocumentCode :
171932
Title :
Measuring capacitance of various types of structures
Author :
Dulik, Miroslav ; Jurecka, Stanislav
Author_Institution :
Inst. of Aurel Stodola, Univ. of Zilina, Liptovsky Mikulas, Slovakia
fYear :
2014
fDate :
19-20 May 2014
Firstpage :
640
Lastpage :
644
Abstract :
Capacitance-voltage measurement is one of the methods to obtain information about an electrical system, circuit or circuit element. Different capacitors have different properties, like maximum capacitance or variable capacitance depending on input voltage. This second characteristic is especially particular for MOS structures. To measure this variable capacitance, it´s necessary to use measuring device which is capable of changing input voltage and measuring capacitor voltage during the all charging process. We proposed experimental method suitable for analysis of transient processes connected with charging of capacitive circuits.
Keywords :
MOS capacitors; capacitance measurement; voltage measurement; MOS structure; capacitance-voltage measurement; capacitive circuit; capacitor; circuit element; electrical system; transient process analysis; Area measurement; Capacitance; Capacitors; Steady-state; MOS; capacitance; capacitor; measuring; methods; semiconductors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ELEKTRO, 2014
Conference_Location :
Rajecke Teplice
Print_ISBN :
978-1-4799-3720-2
Type :
conf
DOI :
10.1109/ELEKTRO.2014.6848978
Filename :
6848978
Link To Document :
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