DocumentCode
171932
Title
Measuring capacitance of various types of structures
Author
Dulik, Miroslav ; Jurecka, Stanislav
Author_Institution
Inst. of Aurel Stodola, Univ. of Zilina, Liptovsky Mikulas, Slovakia
fYear
2014
fDate
19-20 May 2014
Firstpage
640
Lastpage
644
Abstract
Capacitance-voltage measurement is one of the methods to obtain information about an electrical system, circuit or circuit element. Different capacitors have different properties, like maximum capacitance or variable capacitance depending on input voltage. This second characteristic is especially particular for MOS structures. To measure this variable capacitance, it´s necessary to use measuring device which is capable of changing input voltage and measuring capacitor voltage during the all charging process. We proposed experimental method suitable for analysis of transient processes connected with charging of capacitive circuits.
Keywords
MOS capacitors; capacitance measurement; voltage measurement; MOS structure; capacitance-voltage measurement; capacitive circuit; capacitor; circuit element; electrical system; transient process analysis; Area measurement; Capacitance; Capacitors; Steady-state; MOS; capacitance; capacitor; measuring; methods; semiconductors;
fLanguage
English
Publisher
ieee
Conference_Titel
ELEKTRO, 2014
Conference_Location
Rajecke Teplice
Print_ISBN
978-1-4799-3720-2
Type
conf
DOI
10.1109/ELEKTRO.2014.6848978
Filename
6848978
Link To Document