Title :
Measuring capacitance of various types of structures
Author :
Dulik, Miroslav ; Jurecka, Stanislav
Author_Institution :
Inst. of Aurel Stodola, Univ. of Zilina, Liptovsky Mikulas, Slovakia
Abstract :
Capacitance-voltage measurement is one of the methods to obtain information about an electrical system, circuit or circuit element. Different capacitors have different properties, like maximum capacitance or variable capacitance depending on input voltage. This second characteristic is especially particular for MOS structures. To measure this variable capacitance, it´s necessary to use measuring device which is capable of changing input voltage and measuring capacitor voltage during the all charging process. We proposed experimental method suitable for analysis of transient processes connected with charging of capacitive circuits.
Keywords :
MOS capacitors; capacitance measurement; voltage measurement; MOS structure; capacitance-voltage measurement; capacitive circuit; capacitor; circuit element; electrical system; transient process analysis; Area measurement; Capacitance; Capacitors; Steady-state; MOS; capacitance; capacitor; measuring; methods; semiconductors;
Conference_Titel :
ELEKTRO, 2014
Conference_Location :
Rajecke Teplice
Print_ISBN :
978-1-4799-3720-2
DOI :
10.1109/ELEKTRO.2014.6848978