Title :
Resolution Test Technique and Influencing Factors Analysis of a Low-background Anti-Compton HPGe γ-ray Spectrometer
Author :
Chunlin, Zhou ; Zhenhua, Xu ; Congxue, Xu
Author_Institution :
Xi´´an Res. Inst. of Hi-Tech., Xi´´an
Abstract :
This paper tests the resolutions under different high voltages, electronics and source´s position of a low-background anti-Compton HPGe gamma-ray spectrometer. The experimental results show that these factors have important influence on resolution. It is experimentally confirmed that the spectrometer can reaches at the best resolution of 1.77 keV at a high voltage of 3250 V under the condition of suited electronics and proper position of the source.
Keywords :
gamma-ray spectrometers; HPGe gamma-ray spectrometer; anti-Compton spectrometer; electron volt energy 1.77 keV; influencing factors analysis; resolution test technique; voltage 3250 V; Electronic equipment testing; Electrons; Gas detectors; Instruments; Manufacturing; Nuclear electronics; Plugs; Spectroscopy; Steel; Voltage; HPGe ¿ -ray spectrometer; Influencing Factors; Resolution Test;
Conference_Titel :
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-1136-8
Electronic_ISBN :
978-1-4244-1136-8
DOI :
10.1109/ICEMI.2007.4350514
