DocumentCode :
171943
Title :
Measurement of PDMS refractive index by low-coherence interferometry
Author :
Kacik, Daniel ; Tatar, Peter ; Martincek, Ivan
Author_Institution :
Dept. of Phys., Univ. of Zilina, Zilina, Slovakia
fYear :
2014
fDate :
19-20 May 2014
Firstpage :
662
Lastpage :
665
Abstract :
We present a modification of the interferometric method for the measurement of the refractive index of the optical sample. The spectral low coherence interferometry technique utilizes an almost all-fiber Michelson interferometer with an air-path variable optical delay line. The length of the air-path variable optical delay line can be easily adapted to the various thickness and refractive indexes of investigated optical samples that is of particular importance for specialty optical sample characterisation. We record a series of spectral interferograms to measure the equalisation wavelength as a function of the path length difference. A second order polynomial fit is applied to the measured data. Comparing the fitting dependencies obtained for polydimethylsiloxane (PDMS) and reference fiber we get the spectral dependence of refractive index of PDMS. The described method can be practical tool for laboratories with the need of inexpensive and easily built set-up for measurement of refractive index of specialty optical samples in a broad spectral range.
Keywords :
Michelson interferometers; fibre optic sensors; light interferometry; optical delay lines; optical polymers; polymer fibres; polynomials; refractive index measurement; PDMS refractive index measurement; air-path variable optical delay line; all-fiber Michelson interferometer; equalisation wavelength; optical sample characterisation; path length difference; polydimethylsiloxane; second order polynomial fit; spectral interferogram; spectral low coherence interferometry technique; Atmospheric measurements; Indexes; Length measurement; Optical interferometry; Optical sensors; Particle measurements; Thickness measurement; PDMS; equalisation wavelength; low-coherence interferometry; refractive index;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ELEKTRO, 2014
Conference_Location :
Rajecke Teplice
Print_ISBN :
978-1-4799-3720-2
Type :
conf
DOI :
10.1109/ELEKTRO.2014.6848983
Filename :
6848983
Link To Document :
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