Title :
A locally autocompensating image sensor
Author :
Friedrich, Nils ; Boehm, Markus
Author_Institution :
Inst. of Microsystem Technol., Siegen Univ., Germany
Abstract :
A locally autocompensating image sensor was designed and fabricated in a 0.35 μm standard CMOS process. Every pixel contains an automatic compensation circuit made of 13 transistors and 4 capacitors on an area of 38×38 μm2 that compensates the part of the photocurrent caused by undesired background illumination. This allows the capture of extremely weak optical signals in scenes with background illumination several hundred times stronger than the active signal. A prototype pixel array with fixed pattern noise (FPN) correction is presented, which demonstrates the enhanced performance of the sensor concept.
Keywords :
CMOS image sensors; compensation; shot noise; 0.35 micron; 38 micron; CMOS; LACS image sensor; fixed pattern noise correction; locally autocompensating image sensor; photon shot noise; pixel array; pixel automatic compensation circuit; undesired background illumination induced photocurrent; CMOS process; Capacitors; Circuits; Image sensors; Lighting; Optical noise; Optical sensors; Photoconductivity; Sensor arrays; Ultraviolet sources;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN :
0-7803-8994-8
DOI :
10.1109/SENSOR.2005.1496458