DocumentCode :
1719491
Title :
A locally autocompensating image sensor
Author :
Friedrich, Nils ; Boehm, Markus
Author_Institution :
Inst. of Microsystem Technol., Siegen Univ., Germany
Volume :
1
fYear :
2005
Firstpage :
479
Abstract :
A locally autocompensating image sensor was designed and fabricated in a 0.35 μm standard CMOS process. Every pixel contains an automatic compensation circuit made of 13 transistors and 4 capacitors on an area of 38×38 μm2 that compensates the part of the photocurrent caused by undesired background illumination. This allows the capture of extremely weak optical signals in scenes with background illumination several hundred times stronger than the active signal. A prototype pixel array with fixed pattern noise (FPN) correction is presented, which demonstrates the enhanced performance of the sensor concept.
Keywords :
CMOS image sensors; compensation; shot noise; 0.35 micron; 38 micron; CMOS; LACS image sensor; fixed pattern noise correction; locally autocompensating image sensor; photon shot noise; pixel array; pixel automatic compensation circuit; undesired background illumination induced photocurrent; CMOS process; Capacitors; Circuits; Image sensors; Lighting; Optical noise; Optical sensors; Photoconductivity; Sensor arrays; Ultraviolet sources;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN :
0-7803-8994-8
Type :
conf
DOI :
10.1109/SENSOR.2005.1496458
Filename :
1496458
Link To Document :
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