Title :
Electronic test equipment for the 80´s
Author :
Henley, W. Frank ; Toney, Jewell
Author_Institution :
Chrysler Corporation, Huntsville, Alabama
Keywords :
Automobiles; Automotive engineering; Circuit testing; Displays; Electronic components; Electronic equipment testing; Engines; Microprocessors; System testing; Test equipment;
Conference_Titel :
Vehicular Technology Conference, 1980. 30th IEEE
DOI :
10.1109/VTC.1980.1622805
