Title :
Research on Conversion Relation Between Square Wave and ESD EMP in the Electromagnetic Damage of Electronic Devices
Author :
Rongqi, Zhang ; Zhiliang, Tan ; Penghao, Xie
Author_Institution :
Mech. Eng. Coll., Shijiazhuang
Abstract :
By proceeding from micro electromagnetic damage function of the device, combining with domestic and foreign research achievement on square wave EMP damage, the relation between the damage data of square wave and it of ESD EMP is analyzed. The dependence among the damage data of square wave and it of ESD EMP is setup tentatively. Then, the conversion among damage voltage of square wave and it of ESD EMP is finished.
Keywords :
electromagnetic pulse; electrostatic discharge; radiation effects; semiconductor device models; ESD EMP; conversion relation; electromagnetic damage; electronic devices; square wave EMP damage; EMP radiation effects; Electromagnetic analysis; Electromagnetic devices; Electromagnetic scattering; Electrostatic discharge; Equations; Instruments; Mechanical variables measurement; Predictive models; Space vector pulse width modulation; ESD; Semiconductor; electromagnetic damage;
Conference_Titel :
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-1136-8
Electronic_ISBN :
978-1-4244-1136-8
DOI :
10.1109/ICEMI.2007.4350532
