Title :
Thallium bromide optical and radiation detectors for X- and gamma-ray spectroscopy
Author :
Hitomi, K. ; Matsumoto, M. ; Muroi, O. ; Shoji, T. ; Hiratate, Y.
Author_Institution :
Dept. of Electron., Tohoku Inst. of Technol., Sendai, Japan
fDate :
6/23/1905 12:00:00 AM
Abstract :
Compound semiconductor, thallium bromide (TlBr), has been investigated as an optical and radiation detector material for use in X- and γ-ray spectroscopy. Single crystals of TlBr have been grown by the traveling molten zone method using zone-purified materials. Direct X- and γ-ray detectors have been fabricated from the TlBr crystals. The direct TlBr detectors have exhibited good spectrometric performances at room temperature. Polarization in TlBr detectors has been observed to deteriorate detector performance. Optical detectors for scintillation spectroscopy have been fabricated from the crystals by depositing an optically transparent electrode of indium-tin-oxide (ITO) on the front surface of the crystals. Quantum efficiency of the TlBr optical detectors has been high in wavelength region below ~460 nm where scintillation emissions of LSO and GSO occur
Keywords :
X-ray detection; X-ray spectroscopy; gamma-ray detection; gamma-ray spectroscopy; semiconductor counters; thallium compounds; TlBr; TlBr crystals; X-ray spectroscopy; detector performance; gamma-ray spectroscopy; optical detector material; optically transparent electrode; quantum efficiency; radiation detector material; scintillation spectroscopy; traveling molten zone method; zone-purified materials; Crystalline materials; Crystals; Gamma ray detection; Gamma ray detectors; Optical detectors; Optical materials; Radiation detectors; Semiconductor materials; Solid scintillation detectors; Spectroscopy;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2001 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-7324-3
DOI :
10.1109/NSSMIC.2001.1009305
