Title :
Single detectors and pixel arrays based on TIBr
Author :
Gostilo, V. ; Owens, A. ; Bavdaz, M. ; Lisjutin, I. ; Peacock, A. ; Sipila, H. ; Zatoloka, S.
Author_Institution :
Baltic Sci. Instruments, Riga, Latvia
fDate :
6/23/1905 12:00:00 AM
Abstract :
TIBr crystals, grown by hydrothermal and Bridgeman-Stockbarger methods, were investigated as potential single and pixel detectors of X-, and gamma-radiation. The technology of detectors manufacture from TlBr crystals is reported. The spectra of the radionuclides Fe-55, Am-241, Cd-109, Co-57 and Cs-137, measured by single TlBr detectors are presented. FWHM energy resolutions of 500 eV at 5.9 keV; 518 eV at 9.87 keV; 670 eV at 13.92 keV; 777 eV at 22.1 keV; 2.7 keV at 59.5 keV; 3.7 keV at 88 keV; 4.4 keV at 122 keV and 29 keV at 662 keV have been achieved. Small format (3×3) pixel detectors with pads 0.35×0.35 mm and gap 0.1 mm were also fabricated on single TIBr crystals of dimensions 2.7×2.7×1.0 mm3. The interpixel resistivities measured at a bias of 50 V were 400-600 GOhm. The pixel leakage currents at a bias of 250 V were typically less than 0.5 nA. The best spectra were obtained at a temperature of -30°C, a shaping time constant of 6 μs and high voltage of 400 V. Energy resolutions of 2.2, 3.0, 3.7 and 29 keV were measured at input energies of 59.5, 88, 122 and 662 keV, respectively. Values of μτ have been evaluated for two different ingots produced by the Bridgeman-Stockbarger method. They are μcτc=2.5×10-4 cm2 V-1 and μhτh~10-6 cm2V-1 for one ingot at 30°C and μ eτe=7×10-5 cm2 V -1 and μhτh=1.5×10-5 cm2 V-1 for the other ingot at -10°C
Keywords :
X-ray detection; X-ray emission spectra; americium; cadmium; caesium; cobalt; crystal growth from melt; gamma-ray detection; iron; leakage currents; semiconductor counters; 263 K; 30 degC; 400 V; 400 to 600 Gohm; 5.9 to 662 keV; 109Cd; 137Cs; 241Am; 55Fe; 57Co; Am; Bridgeman-Stockbarger method; Cd; Co; Cs; FWHM energy resolution; Fe; TlBr; TlBr detectors; X rays; gamma rays; interpixel resistivities; pixel leakage currents; Conductivity; Crystals; Energy resolution; Gamma ray detection; Gamma ray detectors; Leakage current; Manufacturing; Sensor arrays; Temperature; Voltage;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2001 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-7324-3
DOI :
10.1109/NSSMIC.2001.1009307