Title :
A floated absorbing structure for uncooled microbolometer
Author :
Ahn, M.S. ; Han, Y.H. ; Shin, H.J. ; Kim, K.T. ; Lee, S.H. ; Moon, S. ; Oh, M.H.
Author_Institution :
Microsystem Res. Center, Korea Inst. of Sci. & Technol., Seoul, South Korea
Abstract :
We propose a versatile infrared (IR) absorbing structure for uncooled infrared detectors. We have designed an infrared absorber consisting of five thin film layers (dielectric layer/protection layer/active layer/supporting layer/reflecting layer) that produce a quarter-wavelength resonance condition. It has excellent thermal properties, which are not influenced by the deformation of the thermal isolation structure. We fabricated a microbolometer with the proposed IR absorption structure by a surface micromachining technology. We estimated an IR absorptance of 80%. This IR absorption structure can be applied to both surface micromachining and bulk micromachining.
Keywords :
absorbing media; bolometers; dielectric thin films; infrared detectors; light absorption; light reflection; micromachining; microsensors; optical multilayers; resonance; thin films; active layer; bulk micromachining; dielectric layer; floated absorbing structure; infrared absorbing structure; protection layer; quarter-wavelength resonance; reflecting layer; supporting layer; surface micromachining technology; thin film layers; uncooled infrared detectors; uncooled microbolometer; Bolometers; Electromagnetic wave absorption; Infrared detectors; Micromachining; Optical surface waves; Resonance; Temperature; Thermal resistance; Thermal stresses; Voltage;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN :
0-7803-8994-8
DOI :
10.1109/SENSOR.2005.1496485