Title :
Widlar-Widlar voltage-reading temperature sensor
Author :
Bogdan, Marinca V.
Author_Institution :
Fac. of Electron. & Telecommun., Politeh. Univ. of Timisoara, Timisoara, Romania
Abstract :
The paper presents the design of a CMOS integrated circuit whose output voltage varies linearly with temperature. This sensor is implemented using two classical cross-connected current mirrors. The voltage value is read on the resistor of the lower Widlar mirror. We examined how the output voltage varies with temperature considering the open-output circuit. The sensor´s design is made using resistors with negative, null or positive temperature-coefficient values. Circuit performance shall be emphasized when NTC and PTC resistor pairs are used. The maximum slope was computed for the output voltage and the maximum slope condition was estimated too. The circuit was sized to fit a maximum slope, thus resulting in a 6.27% error between the analytical and the simulated slope. The sensor´s performance parameters are: the optimized output voltage slope (3.2813mV/°C), the optimized percentage slope (0.1946%/°C), low current consumption (30μA measured at 20°C), VDDmin of 2.8V, and supply regulation of 4289ppm/V at 3.5V. The sensor occupied-on-chip area is also small: 3075μm2. The total percentage variation of the output voltage slope with the manufacturing process is 25.4%, while the total variation of the output voltage with the manufacturing process amounts to 31.1%.
Keywords :
CMOS integrated circuits; resistors; temperature sensors; CMOS integrated circuit; NTC-PTC resistor pairs; Widlar mirror; Widlar-Widlar voltage-reading temperature sensor; classical cross-connected current mirrors; manufacturing process; open-output circuit; resistor; sensor occupied-on-chip area; sensor performance parameters; temperature 20 degC; voltage 2.8 V to 3.5 V; Manufacturing processes; Mirrors; Resistance; Resistors; Temperature sensors; Transistors; Voltage control; CMOS temperature sensor; PTC; ZTC resistors; use of NTC; voltage-reading temperature sensor;
Conference_Titel :
Telecommunications and Signal Processing (TSP), 2011 34th International Conference on
Conference_Location :
Budapest
Print_ISBN :
978-1-4577-1410-8
DOI :
10.1109/TSP.2011.6043724