Title :
Designs for thin-film-coated semiconductor thermal neutron detectors
Author :
McGregor, Douglas S. ; Klann, Raymond T. ; Gersch, Holly K. ; Sanders, Jeffrey D.
Author_Institution :
SMART Lab., Michigan Univ., Ann Arbor, MI, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
Thin film coated semiconductor detectors have been studied and used as neutron detectors for decades. Unfortunately, with front-irradiated devices, the basic design limits the thermal neutron detection efficiency to only 3.95% for 10B-coated devices and only 4.3% for 6LiF-coated devices. Presented in the following work are several straightforward methods to increase the thermal neutron detection efficiency for thin-film-coated semiconductor thermal neutron detectors
Keywords :
neutron detection; semiconductor counters; 10B-coated; 6LiF-coated; B; LiF; thermal neutron detection efficiency; thin-film-coated semiconductor thermal neutron detectors; Detectors; Electromagnetic wave absorption; Laboratories; Microscopy; Neutrons; Semiconductor devices; Semiconductor films; Stationary state; Telephony; US Department of Energy;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2001 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-7324-3
DOI :
10.1109/NSSMIC.2001.1009315
