DocumentCode :
1720305
Title :
The AFM tweezers: integration of a tweezers function with an AFM probe
Author :
Takekawa, Tetsuva ; Nakagawa, Kazuhisa ; Hashiguchi, Gen
Author_Institution :
Fac. of Eng., Kagawa Univ., Takamatsu, Japan
Volume :
1
fYear :
2005
Firstpage :
621
Abstract :
A prototype of AFM (atomic force microscope) tweezers is presented. In order to combine the function of nano objects manipulation with AFM observation, we have developed a tweezers-type AFM probe device using micromachining technology. The device has two thin wedge-type arms shaped by anisotropic etching and local oxidation of silicon techniques; one arm plays the role of an AFM probe, and another plays that of a manipulation probe in cooperation with monolithically fabricated microactuators. We have successfully demonstrated the function of picking up nanoparticles by the developed AFM tweezers.
Keywords :
atomic force microscopy; etching; microactuators; micromachining; micromanipulators; nanoparticles; nanopositioning; oxidation; probes; silicon; AFM probe; AFM tweezers; Si; anisotropic etching; atomic force microscope; local silicon oxidation; micromachining technology; monolithically fabricated microactuators; nano object manipulation; thin wedge-type arms; Anisotropic magnetoresistance; Arm; Atomic force microscopy; Etching; Microactuators; Micromachining; Oxidation; Probes; Prototypes; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN :
0-7803-8994-8
Type :
conf
DOI :
10.1109/SENSOR.2005.1496494
Filename :
1496494
Link To Document :
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