Title :
Comparative analysis of SJ-MOSFET and conventional MOSFET by electrical measurements
Author :
Claudio, A. ; Cotorogea, M. ; Macedonio, J.
Author_Institution :
Interior Internado Palmira, Centro Nacional de Investigacion y Desarrollo Tecnologico (CENIDET), Cuernavaca, Mexico
Abstract :
A new type of power MOSFET called super junction MOSFET has been introduced. This new power MOSFET presents an interesting behavior in terms of a RDS(on) reduction for the same silicon area allowing fabrication of high voltage devices. Additionally, a reduction in the parasitic capacitances, improving the commutation characteristics, have been observed. Thus, this new power MOSFET could replace the traditional device in different power converter applications like power supplies (SMPS) or power factor correction applications. The objective of this paper is to explore the switching characteristics and to present a comparison of this new device SJ-MOSFET with the conventional power MOSFET under different operating conditions using special test circuits.
Keywords :
capacitance; circuit testing; commutation; p-n junctions; power MOSFET; power convertors; power factor correction; switched mode power supplies; CoolMOS; MOSFET; SJ-MOSFET; SMPS; avalanche test circuit; commutation characteristics; electrical measurements; hard switching; high voltage devices; parasitic capacitance reduction; power factor correction; power supplies; super junction MOSFET; Circuit testing; Electric variables measurement; Fabrication; MOSFET circuits; Parasitic capacitance; Power MOSFET; Power factor correction; Silicon; Switched-mode power supply; Voltage;
Conference_Titel :
Power Electronics Congress, 2002. Technical Proceedings. CIEP 2002. VIII IEEE International
Print_ISBN :
0-7803-7640-4
DOI :
10.1109/CIEP.2002.1216643