• DocumentCode
    1720464
  • Title

    Test Sequencing Strategy with Imperfect Test

  • Author

    Wei, Wang ; Daren, Yu ; QingHua, Hu

  • Author_Institution
    Harbin Inst. of Technol., Harbin
  • fYear
    2007
  • Abstract
    In this paper, we consider imperfect test sequencing problem under a single fault assumption. Our approach is based on the comparing the imperfect test phenomenon to perfect test, and the integrating this phenomenon into the test sequencing strategy, called IPT-TS strategy. The results of numerical simulations on the test case show that the proposed approach significantly decreases test costs and is more adaptable to solve test sequencing problems with imperfect test for diagnosis when compared with that based on the random strategy.
  • Keywords
    automatic testing; fault diagnosis; integrated circuit testing; fault diagnosis; imperfect test; single fault; test sequencing strategy; Costs; Electronic components; Electronic equipment testing; Energy measurement; Fault diagnosis; Instruments; Numerical simulation; Power engineering and energy; Sequential analysis; System testing; fault diagnosis; imperfect test; test sequencing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-1136-8
  • Electronic_ISBN
    978-1-4244-1136-8
  • Type

    conf

  • DOI
    10.1109/ICEMI.2007.4350558
  • Filename
    4350558