DocumentCode :
1720464
Title :
Test Sequencing Strategy with Imperfect Test
Author :
Wei, Wang ; Daren, Yu ; QingHua, Hu
Author_Institution :
Harbin Inst. of Technol., Harbin
fYear :
2007
Abstract :
In this paper, we consider imperfect test sequencing problem under a single fault assumption. Our approach is based on the comparing the imperfect test phenomenon to perfect test, and the integrating this phenomenon into the test sequencing strategy, called IPT-TS strategy. The results of numerical simulations on the test case show that the proposed approach significantly decreases test costs and is more adaptable to solve test sequencing problems with imperfect test for diagnosis when compared with that based on the random strategy.
Keywords :
automatic testing; fault diagnosis; integrated circuit testing; fault diagnosis; imperfect test; single fault; test sequencing strategy; Costs; Electronic components; Electronic equipment testing; Energy measurement; Fault diagnosis; Instruments; Numerical simulation; Power engineering and energy; Sequential analysis; System testing; fault diagnosis; imperfect test; test sequencing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-1136-8
Electronic_ISBN :
978-1-4244-1136-8
Type :
conf
DOI :
10.1109/ICEMI.2007.4350558
Filename :
4350558
Link To Document :
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