DocumentCode :
1720501
Title :
High SNR secrecy rates with OFDM signaling over fading channels
Author :
Renna, Francesco ; Laurenti, Nicola ; Poor, H. Vincent
Author_Institution :
Dept. of Inf. Eng., Univ. of Padova, Padova, Italy
fYear :
2010
Firstpage :
2692
Lastpage :
2697
Abstract :
Orthogonal frequency division multiplexing (OFDM) systems have enjoyed widespread adoption in high data rate wired and wireless networks, due to their ability to efficiently cope with slowly varying dispersive channels. This paper considers the information theoretic secrecy rates that are achievable by an OFDM transmitter/receiver pair in the presence of an eavesdropper that might either use an OFDM structure or choose a more complex receiver architecture. The analysis is performed through modeling of the OFDM system with an eavesdropper as a special case of a high dimensional multiple-input multiple-output (MIMO) wiretap channel, which allows the secrecy loss due to the OFDM structure constraints, and the information gain for an eavesdropper that uses a more complex receiver to be quantified. The results are expressed in terms of both ergodic rates and outage probabilities for multipath Rayleigh fading channels, and in terms of dependence on the signal to noise ratio (SNR) ratio between the main and eavesdropper channels.
Keywords :
MIMO communication; OFDM modulation; Rayleigh channels; dispersive channels; probability; receivers; transmitters; OFDM signaling; OFDM transmitter-receiver pair; complex receiver architecture; eavesdropper channel; ergodic rates; high SNR secrecy rates; high dimensional multiple input multiple output wiretap channel; information theoretic secrecy rates; multipath Rayleigh fading channel; orthogonal frequency division multiplexing system; outage probability; slowly varying dispersive channel; wireless networks; Capacity planning; Delay; Fading; MIMO; OFDM; Receivers; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Personal Indoor and Mobile Radio Communications (PIMRC), 2010 IEEE 21st International Symposium on
Conference_Location :
Instanbul
Print_ISBN :
978-1-4244-8017-3
Type :
conf
DOI :
10.1109/PIMRC.2010.5671796
Filename :
5671796
Link To Document :
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