• DocumentCode
    1720696
  • Title

    Papyrus: a history-based VLSI design process management system

  • Author

    Chiueh, Tzi-cker ; Katz, Randy

  • Author_Institution
    Dept. of Comput. Sci., State Univ. of New York, Stony Brook, NY, USA
  • fYear
    1994
  • Firstpage
    385
  • Lastpage
    392
  • Abstract
    This paper describes the design and implementation of a VLSI design process management system called Papyrus, which is built upon a history-based design process model that supports both routine and exploratory VLSI design processes. Emphasis of this paper is put on the descriptions of Papyrus´s basic data models, design decisions, and implementation details. The operational prototype features a transparent dynamic load balancing scheme to exploit the computation power of networked workstations, an atomicity-guarantee mechanism to preserve the high-level abstraction of the design task construct, an interactive design-history manipulation facility, and a set of storage management techniques to reduce the storage overhead entailed by the single assignment update semantics, which is crucial to the support of the so-called rework mechanism. This system also embodies an innovative history-based meta-data inference scheme that automates many previously user-responsible design data management functions
  • Keywords
    VLSI; circuit CAD; inference mechanisms; storage management; Papyrus; atomicity-guarantee mechanism; design decisions; history-based VLSI design process management system; implementation details; meta-data inference scheme; storage management; storage overhead; transparent dynamic load balancing scheme; user-responsible design data management functions; Computer network management; Computer networks; Data models; Load management; Manipulator dynamics; Power system modeling; Process design; Prototypes; Very large scale integration; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Engineering, 1994. Proceedings.10th International Conference
  • Conference_Location
    Houston, TX
  • Print_ISBN
    0-8186-5402-3
  • Type

    conf

  • DOI
    10.1109/ICDE.1994.283055
  • Filename
    283055