Title :
Exposing freshman to microelectronics fabrication as part of an innovative materials science course
Author :
Palmer, Mark A. ; Pearson, Robert E. ; Atkinson, Gary M.
Author_Institution :
Sch. of Eng., Virginia Commonwealth Univ., Richmond, VA, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
An innovative materials science course for first year students has been developed with the support of the National Science Foundation. The goal of this course is for students to be able to make design decisions based on experimental data. To attain this goal, an interactive recitation has replaced the lecture as the key learning experience, and the laboratory exercises are fully integrated into the course. There is no separate laboratory component, as laboratory exercises are used to illustrate course material and required as part of the homework assignments and subject matter on examinations. When discussing relationships between electrical properties and performance, student teams take part in the fabrication of a semiconductor chip. Each team performs one step and presents their results to the class. The experience has very been successful
Keywords :
educational courses; electronic engineering education; integrated circuit technology; materials science; semiconductor technology; student experiments; National Science Foundation; course material; design decisions; electrical performance; electrical properties; examination subject matter; first year students; homework assignments; interactive recitation; laboratory exercise integration; laboratory exercises; learning experience; materials science course; microelectronics fabrication; semiconductor chip fabrication; student teams; Chemistry; Education; Educational institutions; Educational programs; Fabrication; Laboratories; Materials science and technology; Mechanical engineering; Microelectronics; Semiconductor materials;
Conference_Titel :
University/Government/Industry Microelectronics Symposium, 2001. Proceedings of the Fourteenth Biennial
Conference_Location :
Richmond, VA
Print_ISBN :
0-7803-6691-3
DOI :
10.1109/UGIM.2001.960309