Title :
Guaranteed method for the estimation of dielectric relaxation model parameters
Author :
Raissi, T. ; Ibos, L. ; Ramdani, N. ; Candau, Y.
Author_Institution :
Paris XII Univ., Creteil, France
Abstract :
In this paper, a guaranteed method for the estimation of dielectric relaxation model parameters is presented. The only assumption used is that data uncertainty is bounded. The main difference with classical methods based on least squares minimisation is that the solution is not a point but leads to a set. When least squares method are used, the model structure should be known. In some cases, this information is not available (for instance because there is not enough data); in this case the identification process can lead to unacceptable results. In this paper, a new technique, based on interval analysis, allowing rejection of models that are not consistent with data is presented.
Keywords :
dielectric relaxation; least squares approximations; data uncertainty; dielectric relaxation model parameters; interval analysis; least squares minimisation; Dielectric materials; Dielectric measurements; Equations; Frequency domain analysis; Frequency measurement; Least squares methods; Minimization methods; Parameter estimation; Permittivity; Uncertainty;
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
DOI :
10.1109/ICSD.2004.1350302