• DocumentCode
    1721053
  • Title

    Micro-processing using plasma source ion implantation

  • Author

    Theodore, Nimel ; Wu, Ling Ling ; Sinclair, Charles ; Siggins, Timothy ; Manos, Dennis

  • Author_Institution
    Coll. of William & Mary, Williamsburg, VA, USA
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    126
  • Lastpage
    127
  • Abstract
    Plasma source ion implantation is a viable technique to modify surface properties to achieve desired mechanical, electrical, and optical properties on microscopic surface profiles. Implanting ions into materials has been shown by many to increase surface hardness, reduce friction, and resist corrosion. Preliminary work performed on test electrodes has shown an increase in the suppression of field emission by an order of magnitude from 3 MV/m to 30 MV/m. Processed soda-lime glass slides have demonstrated a dramatic change in optical properties as the index of refraction decreased significantly with light at wavelengths greater than 600 nm. These advantages illustrate the unique capabilities of PSII for micro-processing
  • Keywords
    corrosion resistance; doping profiles; friction; hardness; integrated circuit technology; ion implantation; micromachining; micromechanical devices; plasma materials processing; surface treatment; 600 nm; PSII; corrosion resistance; electrical properties; field emission suppression; friction; index of refraction; mechanical properties; micro-processing; microscopic surface profiles; optical properties; plasma source ion implantation; processed soda-lime glass slides; surface hardness; surface modification; surface properties; test electrodes; Ion implantation; Mechanical factors; Optical materials; Optical microscopy; Optical refraction; Optical surface waves; Particle beam optics; Plasma properties; Plasma sources; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 2001. Proceedings of the Fourteenth Biennial
  • Conference_Location
    Richmond, VA
  • ISSN
    0749-6877
  • Print_ISBN
    0-7803-6691-3
  • Type

    conf

  • DOI
    10.1109/UGIM.2001.960312
  • Filename
    960312