DocumentCode
172151
Title
Advanced requirements on SPDs protecting sensitive equipment
Author
Hongjun Li ; Niansheng Xu ; Weie Chen ; Brocke, Ralph
Author_Institution
DEHN Surge Protection (Shanghai) Co. Ltd., Shanghai, China
fYear
2014
fDate
11-18 Oct. 2014
Firstpage
1206
Lastpage
1211
Abstract
Nowadays SPDs are of essential importance to protect highly sensitive, electronic devices installed closely to electric distribution systems and switchgear installations. The increasing numbers of applications require that not only the different stages of SPDs, installed e.g. at the building entrance and in electric distribution systems, are well coordinated, but that they are also coordinated with the equipment to be protected. In these cases, the protective function of the SPDs has to be coordinated with the individual immunity of the equipment against energetic, conductive impulse voltages and impulse currents. It can be shown that the coordination behavior depends on the technology used as a protective component in the SPD. Current SPD standards [I], [2], electric installation standards [3] [4] and equipment EMC-standards [5] give requirements and test procedures that have to be fulfilled by the SPDs and have to be withstood by the equipment. In order to verify the immunity against partial lightning currents of the complete system laboratory tests on a system level are a suitable approach. The proposed test schemes for complete systems have been successfully performed on various applications. Examples will be presented.
Keywords
electrical installation; lightning protection; switchgear protection; SPD; complete system laboratory; conductive impulse voltages; electric distribution systems; electric installation standards; impulse currents; partial lightning currents; protecting sensitive equipment; switchgear installations; Switches; Voltage measurement; EMC; SPD technolgy; coordination; laboratory tests; let-through energy;
fLanguage
English
Publisher
ieee
Conference_Titel
Lightning Protection (ICLP), 2014 International Conference o
Conference_Location
Shanghai
Type
conf
DOI
10.1109/ICLP.2014.6973313
Filename
6973313
Link To Document