Title :
Characterization of base current transport in polyemitter transistors using low frequency noise analysis
Author :
Quon, D.S. ; Sonek, G.J. ; Li, G.P.
Author_Institution :
University of California
fDate :
6/16/1905 12:00:00 AM
Keywords :
Analog circuits; Bipolar transistors; Circuit noise; Electron devices; Frequency; Low-frequency noise; Noise measurement; Positron emission tomography; Tunneling; White noise;
Conference_Titel :
Device Research Conference, 1994. 52nd Annual
DOI :
10.1109/DRC.1994.1009409
