Title :
Analysis of leakage currents in multiple gate poly-si thin film transistors for active matrix liquid crystal displays
Author :
Hack, M. ; Wu, I-Wei
Author_Institution :
Xerox Palo Alto Research Center
fDate :
6/16/1905 12:00:00 AM
Keywords :
Active matrix liquid crystal displays; Computer hacking; Electric variables; Leakage current; MOS devices; Numerical simulation; Silicon; Switches; Thin film transistors; Tunneling;
Conference_Titel :
Device Research Conference, 1994. 52nd Annual
DOI :
10.1109/DRC.1994.1009412
