DocumentCode
1721610
Title
Dynamic behavior of selected SiC and Qspeed™ diodes and their comparisons in various practical applications
Author
Spanik, P. ; Frivaldsky, M. ; Radvan, Roman ; Valco, Marek
Author_Institution
Dept. of Mechatron. & Electron., Univ. of Zilina, Zilina, Slovakia
fYear
2012
Firstpage
273
Lastpage
278
Abstract
This paper deals with investigation of dynamic behavior of perspective power diode structures. Main scope is research of impact of diode´s dynamics on the efficiency of switched mode power supply suited for dedicated application. In principle, the investigation of dynamic behavior was made in order to find out dependence of diode losses on the switching frequency and supply voltage. Quantification of received data was based on experimental measurements and consequently was converted into continuous form for graphic interpretation. We have focused on diode structures which today present most innovative solution for high frequency applications. It deals about comparisons of standard Si schottky diode MBR20200CT, SiC diodes SDT10S30, SDT12S60, C4D15120 and highest performance Si diodes - QSpeed products QH12TZ600, LQA12P300. As a merit of performance, each diode has been utilized in proposed converters - LLC converter and PFC converter, whereby efficiency of each converter has been investigated and plotted in the dependency of utilized rectifier.
Keywords
Schottky diodes; elemental semiconductors; losses; rectifiers; silicon compounds; switched mode power supplies; C4D15120 diode; LLC converter; LQA12P300; PFC converter; QH12TZ600; Qspeed diode; SDT10S30 diode; SDT12S60 diode; Schottky diode MBR20200CT; SiC; diode dynamics; diode loss; dynamic behavior; graphic interpretation; power diode structure; rectifier; supply voltage; switched mode power supply; switching frequency; Performance evaluation; Power generation; Schottky diodes; Silicon carbide; Standards; Switching frequency; diode; efficiency; reverse recovery; switching losses;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Electronics (AE), 2012 International Conference on
Conference_Location
Pilsen
ISSN
1803-7232
Print_ISBN
978-1-4673-1963-8
Type
conf
Filename
6328931
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