Title :
A BIST scheme for operational amplifier by checking the stable output of transient response
Author :
Jun, Yuan ; Masayoshi, Tachibana
Author_Institution :
Electron. & Photonic Syst. Eng., Kochi Univ. of Technol., Kami, Japan
Abstract :
This paper presents a built-in self-test (BIST) scheme for operational amplifier (Op Amp). Without any parameters modification, the designed BIST system can be applied to test all the Op Amps in an analog and mixed-signal circuit, even the Op Amps are designed with different architectures. Under test mode, the Op Amp under test is converted into a voltage follower, and then as test stimulus positive and negative step signals are generated by a two-transistor transient signal generator to excite the possible defects. Finally, the stable (desired) output voltage of the voltage follower is analyzed by a voltage checker to determine the Op Amp passed or failed the test. The circuit-level simulation results of the BIST system for three Op Amps in standard CMOS 0.18-μm technology are presented to demonstrate the feasibility of the proposed BIST scheme with high fault coverage.
Keywords :
CMOS analogue integrated circuits; built-in self test; mixed analogue-digital integrated circuits; operational amplifiers; signal generators; transient response; transistors; BIST scheme; CMOS technology; analog circuit; built-in self-test scheme; circuit-level simulation; mixed-signal circuit; negative step signal; op amp; operational amplifier; positive step signal; size 0.18 mum; transient response; two-transistor transient signal generator; voltage checker; voltage follower; MOS devices; Testing; biult-in seft-test; operational amplifier; transient response; voltage follower;
Conference_Titel :
Circuit Theory and Design (ECCTD), 2011 20th European Conference on
Conference_Location :
Linkoping
Print_ISBN :
978-1-4577-0617-2
Electronic_ISBN :
978-1-4577-0616-5
DOI :
10.1109/ECCTD.2011.6043816
