Title :
Tolerance maximisation in fault diagnosis of analogue electronic circuits
Author :
Chruszczyk, Lukas ; Grzechca, Damian
Author_Institution :
Fac. of Autom. Control, Electron. & Comput. Sci., Silesian Univ. of Technol., Gliwice, Poland
Abstract :
This article presents maximisation of components tolerance together with finding optimal frequency of a periodic excitation in fault diagnosis of analogue electronic circuits. Additionally classical two-stage “detection → location” diagnosis sequence is merged into single step in order to reduce test time. Presented optimisation problems are solved by means of a genetic algorithm.
Keywords :
analogue circuits; fault diagnosis; genetic algorithms; analogue electronic circuits; components tolerance; diagnosis sequence; fault diagnosis; genetic algorithm; periodic excitation; tolerance maximisation; Electrical fault detection; Fault detection; Fault location; Genetic algorithms; Optimization; analogue circuits; catastrophic fault; component tolerance; fault detection; fault diagnosis; fault location; genetic algorithm; single fault; test time reduction;
Conference_Titel :
Circuit Theory and Design (ECCTD), 2011 20th European Conference on
Conference_Location :
Linkoping
Print_ISBN :
978-1-4577-0617-2
Electronic_ISBN :
978-1-4577-0616-5
DOI :
10.1109/ECCTD.2011.6043817
