DocumentCode
1721833
Title
Lateral field enhanced band-trap-band tunneling current in a 0.5μm "OFF" state MOSFET
Author
Wang, Tahui ; Huang, C. ; Chang, T.E. ; Chou, J.W. ; Chang, C.Y.
Author_Institution
National Chiao-Tung University
fYear
1994
fDate
6/16/1905 12:00:00 AM
Firstpage
75
Lastpage
76
Keywords
Charge carrier processes; Current measurement; Electron traps; Hot carriers; Leakage current; MOSFET circuits; Steady-state; Stress measurement; Tellurium; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 1994. 52nd Annual
Type
conf
DOI
10.1109/DRC.1994.1009422
Filename
1009422
Link To Document