Title :
Scaling studies of hot electron injection and interface-state generation in deep-submicron silicon mosfets: a monte carlo analysis
Author :
Ellis-Monaghan, J.J. ; Hulfachor, R.B. ; Kim, K.W. ; Littlejohn, M.A.
Author_Institution :
North Carolina State University
fDate :
6/16/1905 12:00:00 AM
Keywords :
Ice; Interface states; MOSFETs; Microelectronics; Monte Carlo methods; Power generation; Probability distribution; Secondary generated hot electron injection; Silicon; Voltage;
Conference_Titel :
Device Research Conference, 1994. 52nd Annual
DOI :
10.1109/DRC.1994.1009424
