DocumentCode :
1721922
Title :
Space charge studies on mid-voltage cable by thermally stimulated depolarization currents in the melting temperature range
Author :
Diego, J.A. ; Canadas, J.C. ; Belana, J. ; Sellarès, J. ; Orrit, I. ; Frutos, F.
Author_Institution :
Dept. de Fisica, Univ. Politecnica de Catalunya, Terrassa, Spain
Volume :
1
fYear :
2004
Firstpage :
248
Abstract :
In the present work, a XLPE mid-voltage cable from General Cable co. has been studied by thermally stimulated depolarization currents. Systematic measurements have been carried out in order to compare the conductive processes in this cable with previous results. Depolarization current as a function of thermal annealing, thermal history, polarizing field and polarizing time and temperature has been obtained. The results show the presence of a broad and complex heteropolar process between 60 and 120 °C as expected. Annealing of the sample at temperatures above 80 °C develops an homopolar contribution associated to chemical components diffused from the cable semiconducting layers into the XLPE bulk. For annealing times of 60 min at 140 °C and 2 days at 90 °C, the homopolar current intensity reaches a maximum, decreasing and recovering the heteropolar sign with further annealing. Experiments performed with different polarizing times and temperatures show as well the presence of an homopolar contribution, overlapped to the heteropolar behavior, that increases continuously with polarizing time. These results indicate that conductive processes within the XLPE are probably responsible of homopolar charge injection.
Keywords :
XLPE insulation; annealing; charge injection; melting point; power cable insulation; space charge; thermal analysis; thermally stimulated currents; 140 degC; 2 day; 60 min; 60 to 120 degC; XLPE midvoltage cable; cable semiconducting layers; conductive processes; heteropolar process; homopolar charge injection; homopolar contribution; midvoltage cable; polarizing field; polarizing temperature; polarizing time; space charge studies; thermal annealing; thermal history; thermally stimulated depolarization currents; Aging; Annealing; Chemicals; Conductivity measurement; Dielectric materials; History; Polarization; Semiconductivity; Space charge; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
Type :
conf
DOI :
10.1109/ICSD.2004.1350337
Filename :
1350337
Link To Document :
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