• DocumentCode
    1721997
  • Title

    A DC voltage capacitance matching tester

  • Author

    McNeill, Bruce W. ; Hanle, Chris

  • Author_Institution
    AT&T Bell Labs., Allentown, PA, USA
  • fYear
    1997
  • Firstpage
    194
  • Lastpage
    197
  • Abstract
    We developed a self-contained capacitor matching tester that requires only the application and measurement of DC voltages. The test circuit includes its own oscillator, a nonoverlapping clock generator, and a second-order active lowpass filter. Our measurement accuracy is about 0.005% 3-sigma, and the tester is 1000 microns high by 300 microns wide
  • Keywords
    capacitance measurement; capacitors; electron device testing; test equipment; voltage measurement; DC voltage measurement; nonoverlapping clock generator; oscillator; second-order active lowpass filter; self-contained capacitor matching tester; test circuit; Automatic testing; Capacitance; Capacitors; Circuit noise; Circuit testing; Filters; Frequency; Operational amplifiers; Oscillators; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1997. ICMTS 1997. Proceedings. IEEE International Conference on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-3243-1
  • Type

    conf

  • DOI
    10.1109/ICMTS.1997.589394
  • Filename
    589394
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1721997