Title :
A frequency-domain study of lock range of harmonic oscillators with multiple injections
Author :
Yuan, Fei ; Zhou, Yushi
Author_Institution :
Dept. of Electr. & Comput. Eng., Ryerson Univ., Toronto, ON, Canada
Abstract :
This paper presents a frequency-domain study of the lock range of harmonic oscillators with multiple injections. The intrinsic relation between the lock range of harmonic oscillators with multiple injections and that with a single injection is obtained. We show that harmonic oscillators with multiple injections exhibit a larger lock range as compared with those with single injection if the phases of the injection signals is properly chosen. The findings are validated using LC oscillators with single injection and dual injections designed in IBM 130 nm 1.2 V CMOS technology.
Keywords :
CMOS integrated circuits; oscillators; CMOS technology; LC oscillator; frequency-domain study; harmonic oscillator; injection signal; lock range; multiple injections; size 130 nm; voltage 1.2 V; CMOS integrated circuits; CMOS technology; Frequency domain analysis; Harmonic analysis; Oscillators; Wireless communication; Wireless sensor networks; Harmonic oscillators; injection-locking;
Conference_Titel :
New Circuits and Systems Conference (NEWCAS), 2012 IEEE 10th International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-0857-1
Electronic_ISBN :
978-1-4673-0858-8
DOI :
10.1109/NEWCAS.2012.6328948
