Title :
Total dose performance of radiation hardened voltage regulators and references
Author :
McClure, S.S. ; Gorelick, J.L. ; Pease, R.L. ; Rax, B.G. ; Ladbury, R.L.
Author_Institution :
Jet Propulsion Lab., Pasadena, CA, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
Total dose tests of commercially available radiation hardened bipolar voltage regulators and references show reduced sensitivity to low dose rate enhancement and varying sensitivity to bias under exposure. Behavior of critical parameters in different dose rate and bias conditions is compared and the impact to hardness assurance methodology is discussed
Keywords :
BIMOS integrated circuits; radiation effects; radiation hardening (electronics); reference circuits; voltage regulators; 2.5V voltage reference microcircuits; BiMOS process; Enhanced Low Dose Rate Sensitivity; HS1009; RH 1009; bias conditions; bipolar voltage regulators; hardness assurance methodology; low dose rate enhancement; radiation hardened voltage regulators; reduced sensitivity; shunt regulator diode; total dose performance; Degradation; Low voltage; Microelectronics; Performance evaluation; Propulsion; Radiation hardening; Regulators; Satellites; System testing; Telephony;
Conference_Titel :
Radiation Effects Data Workshop, 2001 IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7199-2
DOI :
10.1109/REDW.2001.960440
