Title :
A multiple power analysis breaks the advanced version of the randomized addition-subtraction chains countermeasure against side channel attacks
Author :
Okeya, Katsuyuki ; Sakurai, Kouichi
Author_Institution :
Syst. Dev. Lab., Hitachi Ltd., Yokohama, Japan
Abstract :
We show that the advanced version of the randomized addition-subtraction chains countermeasure against side channel attacks is vulnerable to a multiple power analysis attack, a new kind of side channel attack, under distinguishability between addition and doubling. The side channel attack takes advantage of information leaked during execution of a cryptographic procedure. The randomized addition-subtraction chains countermeasure was proposed by E. Oswald and M. Aigner (see Lect. Notes in Comp. Sci., vol.2162, p.39-50, 2001), and is based on a random decision inserted into computations. The countermeasure has two versions; the basic version and the advanced version. The basic version has been proved to be vulnerable to a side channel attack. This is due to a shrinkage of states for randomization if a bit of the secret scalar is zero. However, the advanced version does not have such a shrinkage. The multiple power analysis uses plural AD sequences, which are sequences of additions and doublings, and obtained by the distinguishability and measurements. The multiple power analysis relates the AD sequences to each other, and deduces the secret scalar. A point of the multiple power analysis against the advanced version is that two different states are combined, and regarded as the same state. This provides a shrinkage of states if a bit of the secret scalar is zero.
Keywords :
cryptography; sequences; addition/doubling sequences; cryptographic procedure; distinguishability; multiple power analysis attack; random decision; randomized addition-subtraction chains countermeasure; secret scalar; side channel attacks; Elliptic curve cryptography; Elliptic curves; Energy consumption; Laboratories; Performance evaluation; Power measurement; Smart cards; Timing;
Conference_Titel :
Information Theory Workshop, 2003. Proceedings. 2003 IEEE
Print_ISBN :
0-7803-7799-0
DOI :
10.1109/ITW.2003.1216723