DocumentCode
1722125
Title
Comparative testing of ADSP-21020 digital signal processors from multiple vendors
Author
Duggan, Paul ; Sampson, Steven ; Burnell, Richard ; Koga, Rocky ; Yu, Paul ; Crain, Susan ; McEndree, Steve ; Tausch, Jake ; Sleeter, Dave ; Alexander, Dave
Author_Institution
U. S. Air Force Res. Lab., Kirtland AFB, NM, USA
fYear
2001
fDate
6/23/1905 12:00:00 AM
Firstpage
19
Lastpage
25
Abstract
Total ionizing dose, ionizing dose rate, and single event effects test results are reported on the ADSP-21020 by Analog Devices Inc., the RH21020 by BAE Systenis/Manassas, and the TSC21020F by Atmel Wireless and Microcontrollers
Keywords
digital signal processing chips; radiation hardening (electronics); 20 to 33 MHz; 5.0 V; ADSP-21020 digital signal processors; RH21020; TSC21020F; ionizing dose rate; multiple vendors; single event effects; total ionizing dose; Digital signal processing; Digital signal processors; Electronics packaging; Frequency; Ionizing radiation; Laboratories; Microcontrollers; Performance evaluation; System testing; Telephony;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2001 IEEE
Conference_Location
Vancouver, BC
Print_ISBN
0-7803-7199-2
Type
conf
DOI
10.1109/REDW.2001.960443
Filename
960443
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