• DocumentCode
    1722153
  • Title

    Characterization of various SEE hardened power management ICs

  • Author

    Alaskiewicz, Brian P. ; Doyle, Brent R. ; Newman, Warren H.

  • Author_Institution
    Intersil Corp., Palm Bay, FL, USA
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    26
  • Lastpage
    31
  • Abstract
    Single event effects test results are reported for several power management devices that have been specifically SEE-hardened by design. Single event transient, as well as single event latchup data is presented and discussed
  • Keywords
    ion beam effects; power control; power integrated circuits; radiation hardening (electronics); SEE hardened power management ICs; single event effects; single event latchup data; Circuit testing; Energy management; MOS devices; Packaging; Performance evaluation; Power control; Power system reliability; Radiation hardening; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2001 IEEE
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    0-7803-7199-2
  • Type

    conf

  • DOI
    10.1109/REDW.2001.960444
  • Filename
    960444
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1722153