• DocumentCode
    1722182
  • Title

    Electroluminescence in water-treed XLPE

  • Author

    Tanida, A. ; Muramoto, Y. ; Shimizu, N.

  • Author_Institution
    Electr. & Electron. Eng., Meijo Univ., Nagoya, Japan
  • Volume
    1
  • fYear
    2004
  • Firstpage
    272
  • Abstract
    Electroluminescence (EL) occurs in initiation phase of electrical tree and is considered to be a probe of the degradation of polymer insulating materials. On the other hand, under existence of water, water treeing takes place when subjected to a high electric field. Water tree provides a starting point of electrical tree, and therefore is responsible for the final breakdown of power cables with polymeric insulation. We studied the EL characteristics of XLPE with a water-treed region after drying process, and compared with those in virgin XLPE. The dried water-treed XLPE has higher EL activity, namely lower EL inception voltage and higher light intensity. We considered that EL is caused by the process in micro cavity of sub-micron size, namely by collision impact of electrons accelerated in that spaces. The experimental results above suggest that electron acceleration is emphasized by increase of microvoids in water-treed region. Additionally, it can be considered that luminescence center in dried water-treed XLPE is different from that in virgin XLPE.
  • Keywords
    XLPE insulation; drying; electroluminescence; polymer insulators; trees (electrical); voids (solid); cross-linked polyethylene; electrical tree; electroluminescence inception voltage; electron collision impact; microvoids; polymer insulating material degradation; power cable breakdown; power cable polymeric insulation; water tree; water-treed XLPE; Acceleration; Dielectrics and electrical insulation; Electric breakdown; Electroluminescence; Electrons; Plastic insulation; Polymers; Probes; Thermal degradation; Trees - insulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
  • Print_ISBN
    0-7803-8348-6
  • Type

    conf

  • DOI
    10.1109/ICSD.2004.1350343
  • Filename
    1350343