Title :
Total dose and single event effects testing of the Intel pentium III (P3) and AMD K7 microprocessors
Author :
Howard, James W., Jr. ; Carts, Martin A. ; Stattel, Ronald ; Rogers, Charles E. ; Irwin, Timothy L. ; Dunsmore, Curtis ; Sciarini, J. Anthony ; LaBel, Kenneth A.
Author_Institution :
Jackson & Tull Chartered Eng., Washington, DC, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
To understand the radiation sensitivity and radiation response, Intel Pentium III and AMD K7 microprocessors were tested for total ionizing dose and single event effects. The processors have been found to be extremely tolerant to total ionizing dose and no radiation-induced latchups have been observed with protons or heavy ions to an LET of approximately 15 MeV-cm2/mg. Single event upset and functional interrupts have been observed for both protons and heavy ions
Keywords :
ion beam effects; microprocessor chips; proton effects; radiation hardening (electronics); AMD K7 microprocessors; Intel pentium III microprocessor; heavy ions; protons; radiation response; radiation sensitivity; single event effects; total dose effects; total ionizing dose; Computer displays; Computer peripherals; Hardware; Ionizing radiation; Keyboards; Microprocessors; NASA; Protons; Radiation hardening; System testing;
Conference_Titel :
Radiation Effects Data Workshop, 2001 IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7199-2
DOI :
10.1109/REDW.2001.960446
