Author :
Menichelli, M. ; Alpat, B. ; Battiston, R. ; Bizzarri, M. ; Blasko, S. ; Burger, J. ; Caraffini, D. ; Gil, E. Cortina ; Dai, T. ; Haller, C. ; Kounine, A. ; Maris, O. ; Papi, A. ; Plyaskine, V. ; Schartd, D. ; Simon, R.S. ; Steuer, M.
Abstract :
DSPs from Analog Device (ADSP2187 and ADSP2189) have been tested for Single Event Effects (SEE) in order to be used in a Space Station Particle Physics experiment. We tested these devices at GSI (Darmstadt, Germany) with high energy (100 to 800 MeV/nucleon) xenon, gold and uranium ions. We also tested laser induced latchup on ADSP2187L. The results on cross section are compared with those obtained during the beam test
Keywords :
aerospace instrumentation; automatic testing; digital signal processing chips; integrated circuit testing; ion beam effects; laser beam effects; nuclear electronics; ADSP2187L; COTS DSP chips; GSI test beam setup; SEE tests; Space Station particle physics experiment; commercial off-the-shelf DSPs; laser induced latchup; single event effects; Data acquisition; Digital signal processing; Extraterrestrial measurements; Instruments; Low earth orbit satellites; Performance evaluation; Radiation detectors; Space stations; Superconducting magnets; Testing;
