DocumentCode :
1722280
Title :
Determining the quality metrics for PUFs and performance evaluation of Two RO-PUFs
Author :
Kömürcü, Giray ; Dündar, Günhan
Author_Institution :
Nat. Res. Inst. of Electron. & Cryptology, TUBITAK, Kocaeli, Turkey
fYear :
2012
Firstpage :
73
Lastpage :
76
Abstract :
Physical Unclonable Functions (PUFs) are circuit primitives that generate chip specific signatures depending on the uncontrollable components present in the manufacturing process. Authentication, key generation and IP protection are three important usage areas of PUF circuits. Beside unclonability, uniqueness and robustness are the main properties that every PUF should provide. Although a number of PUF types are presented in the literature, standard and satisfactory performance evaluation metrics for these properties or testing methodologies have not been proposed yet. In this work a complete set of quality metrics have been developed for a fair and detailed performance evaluation of PUFs. Secondly, a testing methodology is proposed and confidence interval and confidence level concepts are adopted to PUF evaluation in order to maintain the reliability of the results. We have implemented two Ring Oscillator(RO) based PUF circuits on FPGA and evaluated their performance in varying environmental conditions in detail, according to the quality metrics that are proposed.
Keywords :
cryptography; field programmable gate arrays; integrated circuit testing; logic design; oscillators; performance evaluation; reliability; FPGA; IP protection; PUF performance evaluation; PUF quality metrics; RO-PUF; RO-based PUF circuits; chip specific signature generation; circuit primitives; confidence level concepts; environmental conditions; key generation; manufacturing process; performance evaluation metrics; physical unclonable functions; ring oscillator-based PUF circuits; testing methodologies; unclonability; uncontrollable components; Error analysis; Integrated circuits; Performance evaluation; Robustness; Security; Temperature measurement; FPGA; PUF; Physical Unclonable Functions; Ring Oscillator; Robustness; Uniqueness; confidence level; quality metrics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
New Circuits and Systems Conference (NEWCAS), 2012 IEEE 10th International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-0857-1
Electronic_ISBN :
978-1-4673-0858-8
Type :
conf
DOI :
10.1109/NEWCAS.2012.6328959
Filename :
6328959
Link To Document :
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