Title :
New design of transient-noise detection circuit with SCR device for system-level ESD protection
Author :
Ker, Ming-Dou ; Lin, Wan-Yen
Author_Institution :
Inst. of Electron., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Abstract :
A new SCR-based transient detection circuit for on-chip protection design against system-level ESD-induced electrical transient disturbance is proposed and verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the new proposed detection circuit can successfully memorize the occurrence of system-level ESD-induced electrical transient events. The detection output can be cooperated with firmware operation to automatically execute system recovery procedure, therefore the immunity of microelectronic systems against system-level ESD test can be effectively improved.
Keywords :
electrostatic discharge; thyristors; CMOS process; SCR based transient detection circuit; SCR device; execute system recovery procedure; firmware operation; microelectronic system; onchip protection design; silicon chip; system level ESD induced electrical transient disturbance; system level ESD induced electrical transient event; system level ESD protection; system vlevel ESD test; transient noise detection circuit; CMOS integrated circuits; Electrostatic discharges; Microprogramming; Substrates; System-on-a-chip; Thyristors; Transient analysis;
Conference_Titel :
New Circuits and Systems Conference (NEWCAS), 2012 IEEE 10th International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-0857-1
Electronic_ISBN :
978-1-4673-0858-8
DOI :
10.1109/NEWCAS.2012.6328961
