Title :
Single event latchup and total dose testing of spacecraft electronic components
Author :
Warren, Kevin ; Roth, David ; Kinnison, Jim ; Carkuff, Bliss
Author_Institution :
Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
Single event latchup (SEL) and total dose test results for candidate spacecraft electronic components are presented. Devices tested were analog, digital, and mixed signal integrated circuits under consideration in spacecraft electronics
Keywords :
aerospace testing; integrated circuit testing; ion beam effects; space vehicle electronics; analog integrated circuit; digital integrated circuit; heavy ion irradiation; mixed signal integrated circuit; single event latchup; spacecraft electronics; total dose testing; Circuit testing; Current supplies; Electronic components; Electronic equipment testing; Event detection; Laboratories; Monitoring; Performance evaluation; Pins; Space vehicles;
Conference_Titel :
Radiation Effects Data Workshop, 2001 IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7199-2
DOI :
10.1109/REDW.2001.960457
