DocumentCode
1722431
Title
Single event latchup and total dose testing of spacecraft electronic components
Author
Warren, Kevin ; Roth, David ; Kinnison, Jim ; Carkuff, Bliss
Author_Institution
Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
fYear
2001
fDate
6/23/1905 12:00:00 AM
Firstpage
100
Lastpage
105
Abstract
Single event latchup (SEL) and total dose test results for candidate spacecraft electronic components are presented. Devices tested were analog, digital, and mixed signal integrated circuits under consideration in spacecraft electronics
Keywords
aerospace testing; integrated circuit testing; ion beam effects; space vehicle electronics; analog integrated circuit; digital integrated circuit; heavy ion irradiation; mixed signal integrated circuit; single event latchup; spacecraft electronics; total dose testing; Circuit testing; Current supplies; Electronic components; Electronic equipment testing; Event detection; Laboratories; Monitoring; Performance evaluation; Pins; Space vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2001 IEEE
Conference_Location
Vancouver, BC
Print_ISBN
0-7803-7199-2
Type
conf
DOI
10.1109/REDW.2001.960457
Filename
960457
Link To Document