• DocumentCode
    1722451
  • Title

    Device susceptibility update: 1999-2000

  • Author

    Coss, J.R.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    106
  • Lastpage
    126
  • Abstract
    This ninth biennial Compendium. continues the previous work of Nichols, et al., on single event effects (SEE) on microcircuits first published in 1985. Because of the volume of SEE data that has generated over past years, this Compendium only presents data collected and/or published in the last two years
  • Keywords
    integrated circuit testing; ion beam effects; neutron effects; proton effects; device susceptibility; heavy ion irradiation; microcircuit testing; neutron irradiation; proton irradiation; single event effects; Aerospace electronics; Aerospace testing; Automatic testing; Electronic equipment testing; Laboratories; Neutrons; Nuclear and plasma sciences; Physics; Propulsion; Protons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2001 IEEE
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    0-7803-7199-2
  • Type

    conf

  • DOI
    10.1109/REDW.2001.960458
  • Filename
    960458
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1722451