Title :
Diamond shaped frame supported electrostatic scanning micromirror
Author :
Ji, Chang-Hyeon ; Kim, Seong-Hyok ; Yee, Youngjoo ; Choi, Moongoo ; Kim, Sang-Cheon ; Lee, See-Hyung ; Bu, Jong-Uk
Author_Institution :
MS Group, LG Electron. Inst. of Technol., Seoul, South Korea
Abstract :
The paper presents the design, fabrication and measurement of an electrostatic scanning micromirror having a diaphragm mirror plate supported by an array of diamond shaped frame structures. Instead of supporting the diaphragm mirror of a different material with a stiff rim structure at the circumference, the diaphragm mirror plate and the frame structure are fabricated monolithically in the same layer of single-crystal-silicon (Nee, J.T. et al., Proc. IEEE Int. Conf. MEMS, p.704-9, 2000). The scanning micromirror with a 10 μm-thick diaphragm mirror plate, having a planar dimension of 1.5×1.5 mm2, supported by an array of 110 μm-thick rhombic stiffening frames, was fabricated and tested. A mechanical deflection angle of 8.5° at the resonance frequency of 19.55 kHz and 44% reduction of dynamic deformation (Conant, R.A. et al., Proc. IEEE/LEOS Int. Conf. Optical MEMS, p.49-50, 2000), in comparison to the conventional rectangular parallelepiped micromirror, were obtained.
Keywords :
deformation; diaphragms; electrostatic actuators; micromachining; micromirrors; optical scanners; silicon; 1.5 mm; 10 micron; 110 micron; 19.55 kHz; diamond shaped frame; diaphragm mirror plate; dynamic deformation reduction; electrostatic scanning micromirror; mechanical deflection angle; rectangular parallelepiped micromirror; resonance frequency; rhombic stiffening frames; single-crystal-silicon; Electrostatic measurements; Fabrication; Lasers and Electro-Optics Society; Micromechanical devices; Micromirrors; Mirrors; Resonance; Resonant frequency; Shape measurement; Testing;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN :
0-7803-8994-8
DOI :
10.1109/SENSOR.2005.1496622