DocumentCode
1722581
Title
Micro-PIXE analysis of impurities in bow-tie trees
Author
Houdayer, A. ; Hinrichsen, P.F. ; Teesdale, W.J. ; Parpal, J.-L. ; Crine, J.-P.
Author_Institution
Montreal Univ., Que., Canada
fYear
1992
Firstpage
626
Lastpage
637
Abstract
The impurity distributions in the core, wings, and the XLPE (cross-linked polyethylene) insulation surrounding six bow-tie trees found in a 25-kV underground cable were analyzed by scanning micro-PIXE (proton induced X-ray emission) using a focused 0.75-MeV proton beam. The elements Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, Cr, and Fe were mapped with a spatial resolution of 5 μm. Mn, Ni, Cu, and Zn were also observed. The impurities in the bow-tie tree cores could be clearly identified and the spatial correlations between the impurity distributions studied
Keywords
X-ray chemical analysis; cable insulation; electric breakdown of solids; impurity distribution; ion microprobe analysis; organic insulating materials; polymers; power cables; underground cables; 0.75 MeV; 25 kV; bow-tie trees; cable insulation; core; impurity distributions; scanning micro-PIXE; spatial correlations; underground cable; wings; Cable insulation; Chromium; Impurities; Iron; Particle beams; Polyethylene; Protons; Spatial resolution; Trees - insulation; Zinc;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1992. Annual Report. Conference on
Conference_Location
Victoria, BC
Print_ISBN
0-7803-0565-5
Type
conf
DOI
10.1109/CEIDP.1992.283147
Filename
283147
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