• DocumentCode
    1722684
  • Title

    Manufacturer variability of enhanced low dose rate sensitivity (ELDRS) in a voltage comparator

  • Author

    Krieg, Jeff ; Tuflinger, Tom ; Pease, Ronald

  • Author_Institution
    NAVSEA Crane, IN, USA
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    167
  • Lastpage
    171
  • Abstract
    The variability in total dose response of a voltage comparator from five manufacturers is examined. The total dose degradation of input bias current varies by a factor of 100 among manufacturers and only three of the five exhibit ELDRS
  • Keywords
    bipolar integrated circuits; comparators (circuits); integrated circuit testing; radiation effects; sensitivity; ELDRS; bipolar linear circuits; enhanced low dose rate sensitivity; input bias current degradation; space environment; total dose response variability; voltage comparator; Circuit testing; Cranes; Degradation; Life estimation; Manufacturing; Packaging; Performance evaluation; Plastics; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2001 IEEE
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    0-7803-7199-2
  • Type

    conf

  • DOI
    10.1109/REDW.2001.960468
  • Filename
    960468
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1722684