DocumentCode :
1722830
Title :
Electrochemical effects at the conductor/dielectric interface - a description of the mechanism
Author :
Bruggerman, M. ; Kalkner, W. ; Campus, A. ; Smedberg, A.
Author_Institution :
Institut fur Energie-und Autom., Technische Univ. Berlin, Germany
Volume :
1
fYear :
2004
Firstpage :
383
Abstract :
If water is present in the conductor area in cables where an aluminium conductor is used, porous channels can develop in the inner semiconductive layer when exposed to accelerated aging. These porous channels may then initiate and promote growth of vented trees. The development of these channels was investigated by ageing model insulation systems in an accelerated test by use of various materials and ageing parameters. The causes for this electrochemical ageing mechanism have previously been reported; these are further discussed in this paper.
Keywords :
ageing; aluminium; cable insulation; dielectric materials; electrochemistry; insulation testing; porosity; semiconductor-insulator boundaries; trees (electrical); Al; accelerated aging; ageing model insulation systems; cable conductor area; conductor/dielectric interface; electrochemical ageing mechanism; electrochemical effects; exposed; inner semiconductive layer; porous channels; vented tree growth; water presence; Accelerated aging; Aluminum; Cables; Conducting materials; Conductors; Dielectrics; Insulation testing; Life estimation; Materials testing; Trees - insulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
Type :
conf
DOI :
10.1109/ICSD.2004.1350371
Filename :
1350371
Link To Document :
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